7 Annotated Bibliography Author’s name Institution Affiliation Course number and name Instructor’s

7

Annotated Bibliography

Author’s name

Institution Affiliation

Course number and name

Instructor’s name

Assignment due date

Part 1: Annotated Bibliography

SOURCE #1

Our first source is a research report titled “Effective Measurement of Signals in Silicon Carbide (SiC) Power Electronics Systems,” written by Tektronix Inc. Tektronix Inc. is a world-class manufacturer of test and measurement products for many industries. It has the most experience and presence in developing sophisticated measurement solutions. Hence, it is a credible source of information on signal measurement in semiconductor devices.

The process began with a literature search using words like semiconductor device testing and signal measurement. I searched for relevant sources on a reliable search engine and looked for technical information from authoritative sources. Then, I searched for the document on the Tektronix official website and confirmed that the content relates to the measurement of signals in current electronics.

The article describes approaches to evaluating signals in silicon carbide power electronics systems and highlights that proper signal measurement is relevant to getting the most out of such systems. This paper explains and compares different methods of measurement and their difficulties, as well as methods for overcoming them with the help of modern tools [1].

The source is Tektronix, a firm that sells measurement instruments. Although the information is technical and credible, suggesting what their products are ideal for risks biasing the audience.

This source is very informative in studying the current methods and issues surrounding signal measurement, which is essential to test the problem-stated semiconductor devices in this research.

SOURCE #2

Our second source is a web article titled “Keithley 4200A-SCS Parameter Analyzer,” posted by Tektronix Inc. Keithley is a product line of Tektronix Inc., an electronic measurement and testing company highly appreciated globally for delivering excellent and unique testing solutions.

I looked for better parameter analyzers in microprocessors that should be useful in analyzing microprocessors. Then, I considered a few choices and narrowed it down to the selection based on getting the Keithley 4200A-SCS as it has other features—link to the documents found on the official Tektronix webpage.

The document below concerns a Keithley SCS 4200A SC Parameter Analyzer, a system utilized to measure semiconductor attributes. This is enabled by its flexibility in testing the many semiconductor parts and the option of getting an accurate value for the values of the parts [2].

As promotional material from the manufacturer of the Keithley 4200A-SCS, it can only highlight the instrument’s strengths and exclusive features without pointing out its weaknesses or the presence of competing systems.

This source outlines specific technical information on the equipment proposed as a solution in this problem statement, which makes it relevant for acquiring details about the same and its usefulness in SEMI testing.

SOURCE #3

Our third source is a journal article titled “Challenges for Semiconductor Test Engineering: A Review Paper,” written by S. R. Vock, O. J. Escalona, C. Turner, & F. J. Owens. The authors, Vock, Escalona, Turner, and Owens, have authored this work passionately and have rich experience in semiconductor testing and electronics engineering; hence, they offer insight into the challenges likely to be encountered in semiconductor test engineering.

To identify relevant review articles, I performed a literature search using several search engines geared toward academic literature, including Google Scholar, for semiconductor test engineering. After that, I selected only papers relevant to the study and read their abstracts and conclusions. I selected this review paper from the Journal of Electronic Testing because it offers a general and broad look at the topic under consideration.

The review paper presents numerous issues in semiconductor test engineering, including, but not limited to, the rigor involved in testing today’s sophisticated semiconductor devices, hindrances regarding current test technologies, and the worlds that are expected depending on future semiconductor test requirements [3].

The paper provides a balanced view, summarizing the state of semiconductor test engineering and the inherent challenges without promoting specific products or solutions.

This source offers a comprehensive overview of the challenges in semiconductor testing, providing context and supporting the need for advanced equipment like the Keithley 4200A-SCS in our research.

References

[1]

T. Inc, Effective Measurement of Signals in Silicon Carbide (SiC) Power Electronics Systems, February 2018. https://www.tek.com/en/documents/technical-brief/effective-measurement-of-signals-in-silicon-carbide-(sic)-power-electronics-systems.

[2]

T. Inc, Keithley 4200A-SCS Parameter Analyzer, February 2022. https://www.tek.com/en/products/keithley/4200a-scs-parameter-analyzer.

[3]

R. V. S, J. E. O, T. C and J. O. F, “Challenges for Semiconductor Test Engineering,” Journal of Electronic Testing, vol. 28, pp. 365-374, Sep 2012.